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AUTHOR INSTRUCTIONS 

1. General Information 

The original unpublished Technical Papers, Articles and Working Papers having maximum length 6 pages  on the topics related to the theme of the conference are invited for presentation/publication in the  conference proceedings 

  • Kindly ensure that your paper is formatted as per Template (not exceeding 6 pages) single-spaced  double-column pages using 10-point size font on 8.5×11 inch pages (IEEE conference style),  including authors' affiliations, figures, tables, and references. Additional pages per paper above  the 6 pages limit will be charged.  

          Paper Template Link : https://www.ieee.org/conferences/publishing/templates.html

          Paper submission Link : https://cmt3.research.microsoft.com/IC3IoT2024

  • All submissions will undergo a double-blind peer review by the team of peer reviewers based on  originality, relevance to the conference theme, technical strength, significance, quality of results,  and organization and clarity of presentation of the paper.

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2. Plagiarism Policy 

  • The paper prior to submission should be checked for plagiarism from licensed plagiarism software like Turnitin / ithenticate etc. 

  • The similarity content should not exceed 20% (in any case either self contents or others). 

  • Further, you have to strictly implement the following ethical guidelines for publication: 

    • Any form of self-plagiarism or plagiarism from others' work(s) should not be there in the article. 

    • If any model / concept / figure / table / data / conclusive comment by any previously published  work is used in your article, you should properly cite a reference to the original work. 

    • If you are using any copyrighted material, you should acquire prior permission from the copyright  holder. 

All questions about submissions can be sent as mail to : ieeeic3iot2024@sairam.edu.in 

3. Publication

The accepted and presented papers of IC3IoT- 2024 will be forwarded for possible inclusion in the IEEE  Digital Xplore after review by IEEE.

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